Investigation of negative capacitance and junctionless MOSFETs for CMOS scaling

Aachen (2018, 2019) [Dissertation / PhD Thesis]

Page(s): 1 Online-Ressource (x, 114 Seiten) : Illustrationen, Diagramme

Authors

Selected Authors

Han, Qinghua

Identifier

  • REPORT NUMBER: RWTH-2019-00281