Nanoscale n ++ -p junction formation in GeOI probed by tip-enhanced Raman spectroscopy and conductive atomic force microscopy

Melville, NY / American Inst. of Physics (2019) [Journal Article]

Journal of applied physics
Volume: 125
Issue: 24
Page(s): 245703

Authors

Selected Authors

Prucnal, Slawomir
Berencén, Yonder
Wang, Mao
Georgiev, Yordan M.
Erbe, Artur

Other Authors

Khan, Muhammad B.
Boettger, Roman
Hübner, René
Schönherr, Tommy
Kalbacova, Jana
Vines, Lasse
Facsko, Stefan
Engler, Martin
Zahn, Dietrich R. T.
Knoch, Joachim
Helm, Manfred
Skorupa, Wolfgang
Zhou, Shengqiang

Identifier